A flexible STEM scanner with pixelated detector synchronization and server interface for SerialEM Editted/ written by Shahar Seifer, Elbaum lab, Weizmann Institute of Science, Israel. GPL-3.0 license
Shahar Seifer, Lothar Houben, Michael Elbaum, "Flexible STEM with Simultaneous Phase and Depth Contrast", Microscopy and Microanalysis (2021).
Shahar Seifer, Michael Elbaum, Synchronization of scanning probe and pixelated sensor for image-guided diffraction microscopy, HardwareX 14 (2023).
Shahar Seifer, Michael Elbaum, FPGA based scanner and SerialEM server for 4D STEM Electron Tomography (2026).
To keep records of metadata see: https://github.com/elbaum-lab/Session-JSON