The SEM's electron beam can be steered around the sample over a limited range using the IMAGE SHIFT X and Y controls but this appears to be jammed fully at maximum for both axes.
As a consequence, the SEM is unusable at anything other than low magnifications because the central image area is deflected fully to one corner of the CRT readout.
The SEM's electron beam can be steered around the sample over a limited range using the IMAGE SHIFT X and Y controls but this appears to be jammed fully at maximum for both axes.
As a consequence, the SEM is unusable at anything other than low magnifications because the central image area is deflected fully to one corner of the CRT readout.