- [ ] **BSEC /AI studio test** - [ ] Ensure that classification F1 > 0.8 for application - [ ] Test feasibility of dynamic switching between scan and ULP mode - [x] Wrt above decide battery type/nos. - [x] **Microcontroller program components/middleware** - [x] Application - [x] EM2 power manager implementation - [x] Main loop ? (test necessity of RTOS) - [x] Thread - [x] sleepy/MTD (tbd poll interval) - [x] CoAP/S ? - [x] Joiner - [x] RFC 6763 - [x] child supervision - [x] Third party - [x] BSEC integration/lib files (test with c++ compiler first) - [ ] **Software integration** - [ ] Test overall performance wrt prototype - [ ] **Custom Board (Bring-up Test)** - [x] Program/DEBUG/PTI test - [x] vin range [0.9, 3.5] and UVLO test - [x] brown out detection - [x] i2c0 test (400khz) - [x] lfclk (ext.) test - [x] bme688 functional test - [ ] RF performance characterization
BSEC /AI studio test
Microcontroller program components/middleware
Software integration
Custom Board (Bring-up Test)